HP / Agilent 54502A 400 MHZ DIGITIZING OSCILLOSCOPE

The HP/Agilent 54502A is a 400 MHz digitizing oscilloscope designed for signal acquisition and analysis in design verification, manufacturing test, and research environments. This dual-channel instrument captures both repetitive and single-shot signals with real-time sampling up to 400 MSa/s and delivers 400 MHz bandwidth in repetitive mode, 100 MHz in single-shot mode. With 2001-point memory depth in real-time acquisition and programmable triggering down to 1.75 ns glitch detection, the 54502A provides the timing resolution and measurement capability required for precision electronic testing.

Technical Specifications Bandwidth

Repetitive mode: DC to 400 MHz (-3 dB, DC coupled)

Real-time (single-shot) mode: DC to 100 MHz (-3 dB, DC coupled)

Bandwidth reduces to 100 MHz at 1 µs/div and slower time-base settings

Temperature-dependent reduction: 2.5 MHz per °C above +35°C Sampling & Memory

Maximum real-time sampling: 400 MSa/s per channel

Real-time record length: 2001 points

Repetitive record length: 501 points Vertical System

Sensitivity: 2 mV/div to 5 V/div (8-bit, 10-bit via HP-IB with averaging)

Input impedance: 1 MΩ, switchable

Coupling: DC or AC

Vertical gain accuracy: ±0.08% per °C from calibration temperature Timebase & Triggering

Time/division: 1 ns/div to 5 s/div

Internal trigger: DC to 100 MHz coupling; 100–400 MHz sensitivity

External trigger: DC to 250 MHz, down to 1.75 ns glitch detection

Advanced triggering: Edge, pattern, state, delayed, and glitch modes Measurements & Interface

16 automatic pulse parameter measurements

HP-IB (IEEE 488.2) programmability and waveform data access Power & Environment

Input: 115/230 VAC (-25% to +15%), 48–66 Hz

Power consumption: 350 VA maximum

Operating temperature: ±10°C from calibration temperature (8+ averages required)

Key Features

Dual simultaneous channels for multi-signal comparison

High real-time sampling rate supports fast transient capture

Switchable input impedance and AC/DC coupling for flexible signal conditioning

Advanced logic triggering with sub-nanosecond glitch detection

Direct waveform access via HP-IB for automated test systems

Typical Applications

Design verification of high-speed digital and analog circuits

Manufacturing test and quality assurance

Signal integrity analysis in laboratory environments

Single-shot pulse and transient characterization

Compatibility & Integration HP-IB (IEEE 488.2) interface enables integration into automated test environments and remote instrument control.