Agilent / Keysight E4916A Crystal Impedance /LCR Meter

The Agilent/Keysight E4916A Crystal Impedance/LCR Meter is a benchtop instrument engineered for precise characterization of crystal resonators and passive electronic components using the transmission π network method. Compliant with IEC444 standard, it delivers accurate measurements of resonant frequencies (Fr, Fs, Fa, FL), capacitance (CI, C0, C1), inductance (L1), resistance (R1, R0, G0), quality factor (Q), spurious response, and equivalent circuit parameters. The meter addresses limitations of conventional oscillation-method approaches, particularly in high-frequency and low-drive-level applications critical to telecommunications, aerospace, and electronic manufacturing.

Technical Specifications

• Frequency Range: 1 MHz to 180 MHz with 1 mHz resolution


• Frequency Accuracy: ±2 ppm (±0.2 ppm with external reference input)


• Impedance Measurement: 5 to 125 Ω with 10 mΩ resolution


• Drive Level: 0.1 nW to 1 mW; up to 20 mW with optional impedance probe (Option 001)


• Return Loss: 20 dB


• Maximum Input Level: 0 dBm


• Damage Threshold: 25 Vdc, 20 dBm


• Noise Floor: −130 dBm/Hz


• Measurement Time (Fr/CI): 125 ms to 10 s

Key Features

• Transmission π network measurement method for high-accuracy crystal characterization


• Adjustable power level control enabling drive-level dependency evaluation


• Built-in DLD (Drive Level Dependency) and EM (Evaporation Monitoring) functions


• PI-Network Calibration function correcting cable extension errors


• Equivalent circuit analysis capabilities


• LCR measurement feature available with Option 010

Interfaces & Integration

• HP-IB (Keysight-IB) interface for external equipment connection


• Parallel I/O for automated testing and handler integration


• Compatible with network analyzer test fixtures


• Compatible with HP 41900A Pi-network fixture for LCR mode operation

Typical Applications Crystal resonator qualification, equivalent circuit parameter extraction, spurious response characterization, and drive-level dependency analysis across telecommunications, aerospace, and high-volume component manufacturing environments.