Advantest R3272 100Hz to 26.5GHz Spectrum Analyzer

The Advantest R3272 is a spectrum analyzer engineered for precision signal analysis across 100 Hz to 26.5 GHz. It delivers absolute amplitude accuracy of ±0.5 dB and noise floor performance of -155 dBm/Hz, making it suitable for characterization of complex signals in development, validation, and maintenance workflows. The instrument combines selectable resolution and video bandwidths (1 Hz to 10 MHz) with six marker functions, multiple detector modes, and advanced measurement capabilities including channel power, adjacent channel power ratio, occupied bandwidth, and phase noise analysis.

Technical Specifications

• Frequency Range: 100 Hz to 26.5 GHz


• Amplitude Range: -155 dBm to +30 dBm


• Resolution Bandwidth (RBW): 1 Hz to 10 MHz (1-3-10 sequence); ±3% accuracy (100 Hz–1 MHz), ±5% accuracy (3 MHz and above)


• Video Bandwidth (VBW): 1 Hz to 10 MHz (1-3-10 sequence); ±3% accuracy (1 Hz–1 MHz), ±5% accuracy (3 MHz and above)


• Frequency Span: 0 Hz (zero span) or 10 Hz to 26.5 GHz (1-2-5 sequence)


• Frequency Accuracy: Absolute ±(span × 0.0005% + RBW × 5%); Relative ±(RBW × 5%)


• Amplitude Accuracy: Absolute ±0.5 dB (post-calibration); Relative ±0.1 dB (over 10 dB range)


• Noise Floor: -155 dBm/Hz at 1 GHz (RBW 1 Hz, VBW 1 Hz, pre-amplifier ON)


• Phase Noise: -110 dBc/Hz at 10 kHz offset (1 GHz carrier)


• Third-Order Intercept (TOI): +15 dBm


• Second Harmonic Distortion: -65 dBc at 0 dBm input


• Input VSWR: <2.0:1 (1 GHz–26.5 GHz, pre-amplifier OFF)

Key Features

• Four detector types: Peak, Sample, Average (RMS), Negative Peak


• Six independent markers with delta and track functionality


• Peak and next-peak search


• Multiple sweep modes: Continuous, Single, Manual


• Six trigger options: Free Run, External, Video, Line, Period, RF Burst


• High-resolution color LCD with logarithmic, linear, RMS, and average trace formats


• Trace storage and screen capture

Measurement Functions Channel power, adjacent channel power, occupied bandwidth, ACPR, spectrum emission mask, C/N ratio, phase noise, and third-order intercept analysis.