Astronics / EADS / Talon Instruments SR192A 50MHz Digital Module

The SR192A is a double-wide VXI digital test module delivering 50 MHz data rates with 5 ns edge placement resolution for high-speed digital pattern generation and analysis. Scalable from 8 to 192 single-ended channels in 8-channel increments, it accommodates up to 12 internal 16-channel I/O modules and two SR101A timing modules per unit. The integrated high-speed data sequencer provides precise control over test patterns, UUT handshaking, timing, format, looping, and conditional testing across TTL, RS-485, ECL, LVDS, and variable voltage logic levels. ## Technical Specifications • Data Rate: Up to 50 MHz • Edge Placement Resolution: 5 ns • Channel-to-Channel Skew: 5 ns • Maximum I/O Channels: Up to 192 single-ended per module • Configurable Range: 8 to 192 channels in 8-channel increments • Internal Module Capacity: Up to 12 modules × 16 channels each • Timing Module Support: Up to two SR101A modules per SR192A • Memory Depth: 128 Kbits per channel (256 Kbits in multiplexed mode) • Data Formats: Hold, RTZ, RT0, RTC • Output Drive: 50 mA source/sink • Input Thresholds: High 2.0 V, Low 0.8 V • Input Impedance: >10 kΩ • Output Impedance: 50 Ω • Short Circuit Protection: Yes ## Key Features • Five-memory architecture: Stimulus, Tristate, Record, Expect, Mask • Multiple SR192A modules synchronize for up to 1,152 total I/O channels • Supports TTL, RS-485, ECL, LVDS, and variable voltage I/O • Trigger inputs from VXI TTL bus, VXI ECL bus, front-panel auxiliary, or any channel • Graphical user interface accelerates test development • LSRTAP file import capability • Visual timing and table definition tools ## Typical Applications • Parallel and serial digital signal testing • Complex UUT handshaking sequences • High-speed pattern generation and capture • Mixed-logic-level test environments ## Compatibility & Integration Double-wide VXI module form factor. Integrates with SR101A timing modules for synchronized multi-module configurations supporting logic standards across industrial and defense test platforms.