Stanford Research SR530 – Dual Phase Lock-In Amplifier
The Stanford Research SR530 is a dual-phase lock-in amplifier designed for precision signal recovery in noisy environments. It features two independent phase-sensitive detectors, allowing simultaneous measurement of in-phase and quadrature components of a signal. With a wide frequency range and high dynamic reserve, the SR530 is ideal for various applications, including optics, materials science, and electronics.
- Model
- Stanford Research SR530
- Calibration
- Available on request
- Price · starting from
- $550
- Status
- In stock
- RFQ ref
- SR530
This unit
The Stanford Research SR530 is a dual-phase lock-in amplifier engineered to recover AC signals buried in noise across the 0.5 Hz to 100 kHz band. It simultaneously measures in-phase (X) and quadrature (Y) components using precision analog sine-wave demodulation, free from harmonic distortion. With input noise as low as 7 nV/√Hz (voltage) and 0.13 pA/√Hz (current), the SR530 resolves signals at nanovolt and femtoampere scales.
Technical Specifications
Signal Detection & Demodulation- Frequency range: 0.5 Hz to 100 kHz
- Dual-phase lock-in architecture with simultaneous RCOSØ and RSINØ outputs
- Analog sine-wave multiplier demodulation (harmonic-free)
- Dynamic reserve: up to 80 dB (20, 40, 60 dB ranges; +20 dB with band-pass filter) Input Specifications
- Differential inputs; selectable voltage or current mode
- Voltage input impedance: 100 MΩ + 25 pF (AC coupled)
- Voltage input noise: 7 nV/√Hz at 1 kHz
- Full-scale sensitivity (voltage): 100 nV to 500 mV
- Full-scale sensitivity (current): 100 fA to 0.5 pA
- Current input gain: 10⁶ V/A
- Current input noise: 0.13 pA/√Hz at 1 kHz
- Common-mode rejection: 100 dB (DC to 1 kHz, −6 dB/octave above 1 kHz)
- Maximum voltage input: 100 VDC; 10 VAC damage threshold; 2 Vpp saturation
- Maximum current input: 10 pA damage threshold; 1 pApp saturation Filtering
- Line notch filter: 50 dB rejection (45–65 Hz adjustable)
- Second harmonic notch filter: 50 dB rejection
- Tracking band-pass filter: automatic frequency tracking
- Time constants: 1 ms to 100 seconds (two cascaded stages)
- Rolloff: 6 or 12 dB/octave Reference
- External reference: sine wave or pulsed edges (0.5 Hz to 100 kHz)
- Harmonic detection at fundamental and second harmonic
- Optional internal oscillator: 0.01, 0.1, or 1 Vrms amplitude; 20 mA drive capability
Key Features
- Nanovolt sensitivity with differential input architecture
- Inherently linear analog multiplier eliminates harmonic artifacts
- Dual notch filters suppress line-frequency interference
- Selectable dynamic reserve optimizes signal-to-noise in high-interference environments
- Configurable time constants enable trade-off between settling speed and noise reduction
Typical Applications Low-level AC signal measurement in photometry, electrochemistry, materials characterization, and precision impedance analysis.
Compatibility & Integration External reference input accepts standard function generators or pulsed signals. Optional internal VCO provides self-contained operation without external reference infrastructure.
Specifications
| Parameter | Value |
|---|---|
| Frequency Range | 0.5 Hz to 100 kHz | Voltage / Current Range: 100 nV to 500 mV full-scale |
Stanford Research SR530 — Repair & Calibration Service
Aumictech offers NIST-traceable calibration and repair for the Stanford Research SR530. Calibration covers full-scale sensitivity accuracy at 1 V and at each decade below the maximum range, time constant accuracy, phase offset and phase noise verification, reference frequency range and accuracy, dynamic reserve verification, and noise floor (V/√Hz) measurement. All calibrations ship with a NIST-traceable certificate. Turnaround is typically 1–3 business days after receipt.
Common Stanford Research SR530 faults: keypad ribbon cable wear (intermittent key response), DSP board failure, reference input circuit failure, trim pot drift on analog models. Stanford Research SR810/830 most common fault is front-panel keypad ribbon cable wear causing intermittent key response. DSP board failure is rare but results in loss of lock and incorrect readings. EG&G 5204/5210 analog demodulator units most commonly develop trim pot drift requiring phase and offset recalibration.
Stanford Research SR530 price
This Stanford Research SR530 is listed at $550. Calibration is available separately from $450. Contact us for volume pricing or if you need multiple units.
Stanford Research SR530 calibration cost
NIST-traceable calibration for the Stanford Research SR530 is $450 (standard — pass/fail certificate and calibration sticker) or $650 (full measured data at every test point, reference standards documented, traceability chain included). Calibration for this instrument covers full-scale sensitivity accuracy at 1 V and at each decade below the maximum range, time constant accuracy, phase offset and phase noise verification, reference frequency range and accuracy, dynamic reserve verification, and noise floor (V/√Hz) measurement. Turnaround is 1 to 3 business days after receipt. See full calibration details →
