Rohde & Schwarz ZVA50 10MHz – 50GHz Vector Scalar S-ParaMeter Network Analyzer

The Rohde & Schwarz ZVA50 is a four-port vector network analyzer engineered for precision RF and microwave characterization from 10 MHz to 50 GHz. This instrument delivers dynamic range exceeding 140 dB across its operating bandwidth, making it suitable for demanding measurements of active and passive components in research, development, and production environments. The ZVA50 supports two or four test ports with 50 Ω impedance and 2.4 mm male ruggedized connectors, enabling flexible device characterization.

Technical Specifications

• Frequency Range: 10 MHz to 50 GHz


• Test Ports: 2 or 4 configuration


• Impedance: 50 Ω


• Test Port Connector: 2.4 mm male, ruggedized


• Frequency Resolution: 1 Hz


• Measurement Bandwidth: 1 Hz to 1 MHz (standard); 1 Hz to 5 MHz (with R&S®ZVA-K17 option)


• Measurement Points: 1 to 60,001


• IF Bandwidth: 1/5/30 MHz


• Dynamic Range: >140 dB typical across operating range; up to 150 dB at 1 Hz IF bandwidth with direct receiver access


• Output Power: Typical >13 dBm to >18 dBm depending on frequency band


• Measurement Speed: <3.5 µs per test point; <5 ms for 200-point frequency sweep; <3.5 s for 201-point CW sweep via 100 Mbit/s LAN at 1 MHz bandwidth


• Pulse Profile Resolution: 12.5 ns


• Signal Sources: Up to four independent signal sources; two internal sources standard

Key Features

• Linear and nonlinear amplifier and mixer measurements


• Noise figure measurements


• True differential measurements for balanced-port active devices


• Virtual differential measurement mode for balanced DUT characterization


• Fast synthesizers for reduced measurement time


• Fundamental mixing concept to 24 GHz for high sensitivity and wide dynamic range


• Phase-coherent signal generation


• Absolute phase measurements on mixers with LO access


• Multiple calibration techniques: TOSM, TRL/LRL, TOM, TRM, TNA, UOSM with automatic calibration units available

Typical Applications Component characterization across research, development, and production workflows; amplifier and mixer evaluation; balanced circuit analysis; noise figure assessment; frequency-dependent device behavior under phase-coherent stimulus.