Astronics / EADS / Racal 4152A 6.5 Digit Digital Multimeter

The Astronics/EADS/Racal 4152A is a 6.5-digit VXIbus digital multimeter engineered for high-throughput automated test systems. This single-slot C-size VXI module delivers simultaneous DC and AC voltage and current measurements alongside 2/4-wire resistance, frequency, and DC ratio capabilities - all in one compact instrument. Built for production environments requiring rapid measurement cycles, the 4152A supports limit testing, averaging, math operations, and vector calculations with exceptional switching speed: up to 65 range changes per second and 30 function changes per second. ## Technical Specifications • Form Factor: Single-slot, C-size VXIbus module • Resolution: 6.5 digits • Measurement Functions: DC voltage (1 V, 10 V, 100 V, 300 V ranges); AC voltage (1 V, 10 V, 100 V, 300 V ranges); DC current (1 A, 3 A ranges with 1% overrange on 3 A); AC current (1 A, 3 A ranges); 2-wire and 4-wire resistance (1 kΩ, 10 kΩ, 100 kΩ ranges); frequency (10 Hz to 1000 Hz); DC ratio measurements • Reading Speed: Up to 6 readings/second at 6.5 digits with 0.0019% accuracy; up to 1000 readings/second at 4.5 digits • Frequency Measurement: Gate times selectable at 10 ms, 100 ms, or 1 s; accuracy ±4% of reading ±1% of full scale (10–500 Hz) or ±5% of reading ±1% of full scale (500–1000 Hz) • AC Voltage Accuracy: 100 mV to 100 V ranges specified for sine wave input exceeding 5% of range; 300 V range specified for sine wave input exceeding 15% of range; 300 VAC limited to 50 kHz • 2-Wire Resistance: Add 0.2 Ω additional error (or use Math Null function) • Operating Temperature: 0 °C to 55 °C ## Key Features • Fast function and range switching enables rapid test cycle times • Math and vector operations for on-instrument data processing • Frequency measurement with multiple gate time options for resolution/speed trade-off • DC ratio capability for ratiometric testing • Native support for LabWindows/CVI and LabVIEW environments ## Typical Applications Automated production test systems, component characterization, board-level functional testing, high-volume manufacturing environments. ## Compatibility & Integration VXIbus architecture with standard instrument drivers for LabWindows/CVI and LabVIEW integration.