Agilent / Keysight DSOX91604A Infiniium High-Performance Oscilloscope: 16GHz

The Keysight DSOX91604A Infiniium is a 16 GHz oscilloscope engineered for advanced signal analysis in high-speed applications. Native bandwidth is upgradeable to 33 GHz, enabling accurate capture and analysis of complex waveforms across telecommunications, semiconductor testing, and research environments. The instrument delivers measurement accuracy through a low noise floor of 1.45 mVrms at 16 GHz (50 mV/div) and jitter measurement floor below 100 fS, ensuring signal integrity in precision testing.

Technical Specifications

• Bandwidth: 16 GHz native (upgradeable to 33 GHz)


• Sample Rate: 80 GSa/s on 2 channels; 40 GSa/s on 4 channels


• Memory Depth: Up to 2 Gpts total acquisition memory; 20 Mpts per channel standard (upgradeable); 50 Mpts per channel on DSA models


• Noise Floor: 1.45 mVrms at 16 GHz at 50 mV/div; 2.30 mVrms at 33 GHz at 50 mV/div


• Jitter Measurement Floor: Below 100 fS


• Display: 12.1-inch XGA (1024 x 768) color touch screen with 256-level intensity or color-graded persistence


• Probing: 30 GHz oscilloscope probing system with InfiniiMax III/III+ probe amplifiers and customized S-parameter correction

Key Features

• Fully integrated 16 digital channels (MSO models) with time-aligned acquisition


• Up to 20 channels usable simultaneously in mixed-signal configurations


• Advanced triggering with InfiniiScan zone-qualified capability


• Spurious Free Dynamic Range (SFDR) through recalibrated probe correction


• Bandwidth-upgradeable probes for evolving test requirements


• PrecisionProbe characterization for any oscilloscope input

Triggering & Analysis

• Comprehensive jitter, trigger, and protocol analysis tools


• Pre-built compliance testing software


• Memory system debug and validation modes


• MATLAB integration for custom measurement routines


• User-defined application add-on capability

Typical Applications Telecommunications signal integrity, semiconductor device characterization, high-speed digital design validation, and research requiring sub-100 fS jitter measurement capability.