Agilent/Keysight P5027A

The Agilent/Keysight P5027A is a four-port USB Vector Network Analyzer delivering S-parameter measurements to 44 GHz in a compact form factor. This instrument combines the measurement science of Keysight's flagship PNA, ENA, and PXI VNAs into a space-efficient design controlled via external computer. The P5027A supports multiport calibrated measurements, pulsed-RF analysis, time-domain characterization, and noise figure measurements with vector correction - making it suitable for rapid component and system characterization across RF and microwave frequencies.

Technical Specifications

• Frequency Range: 100 kHz to 44 GHz


• Ports: 4 (2.4 mm female connectors)


• Dynamic Range: 132 dB


• Output Power: 5 dBm


• Power Sweep Range: −50 dBm to +5 dBm


• Noise Floor: −127 dBm


• Harmonic Content: −15 dBc


• Port Impedance: 50 Ohms


• Reference Input/Output: MCX connectors


• Interfaces: USB 3.0, GPIB, Ethernet/LAN, RS-232


• Dimensions: 176 × 68 × 333 mm (W × H × D)


• Weight: 3.18 kg


• Operating Temperature: 0 to 50 °C

Key Features

• Embedded local oscillator with source phase control capability


• Automatic fixture removal for efficient de-embedding


• Spectrum analysis and vector signal analysis hardware options


• Pulse modulation available for internal sources


• Electronic calibration (ECal) module compatibility across Keysight's module portfolio


• Optional second source (Option 402) for differential measurements


• Calibration documentation options including ANSI Z540-1-1994 accreditation

Typical Applications

• Pulsed-RF component and amplifier characterization


• Gain compression and spectral purity measurements


• Time-domain reflectometry and impedance analysis


• Noise figure assessment with vector correction


• Multiport device characterization and phase coherence analysis

Compatibility & Integration The P5027A shares the same graphical user interface and measurement methodology as Keysight's PNA platform, enabling consistent workflows across benchtop and modular instruments. Multiple software options extend capability for complex measurement scenarios including basic pulsed-RF analysis, multi-instrument coordination, and advanced source control.