Rohde & Schwarz ZVR 10Hz-4GHz 4 Channel Bi-Directional Vector Network Analyzer

The Rohde & Schwarz ZVR is a bidirectional vector network analyzer operating from 10 Hz to 4 GHz with four receiver channels for complete S-parameter characterization. This integrated instrument combines generator, test set, receiver, and RF switch in a single platform, delivering dynamic range exceeding 130 dB and measurement speeds below 125 µs/point. The ZVR executes full two-port calibration using multiple techniques

TOM, TRM, TRL, TNA, TOSM, and TOM-X - with optional automatic calibration via AutoKal.

Its large 26 cm color LCD display includes zoom capability across Smith diagrams and segmented diagram axes. An internal Windows NT PC with dual IEC/IEEE bus interfaces enables standalone operation and integration with CAE systems. Input impedance is 50 Ω; maximum input is +27 dBm at Type N female connectors.

Inherent noise floors below −130 dBm at 10 Hz bandwidth support sensitive measurements, while data transfer completes in under 15 ms for 200-point sweeps via IEC/IEEE bus. Two SWR bridges or directional couplers support flexible test configurations. Sweep rates exceed 25 sweeps/second with 200 points.

Directivity measures 46 dB.

Technical Specifications

• Frequency range: 10 Hz to 4 GHz


• Dynamic range: >130 dB (external measurement option at 10 Hz IF bandwidth); ≥125 dB inherent


• Inherent noise: <−130 dBm (10 Hz measurement bandwidth); <−130 dBm (3 kHz measurement bandwidth)


• Measurement speed: <125 µs/point (normalized); >25 sweeps/s (200 points)


• Data transfer: <15 ms (200 points via IEC/IEEE bus)


• Input impedance: 50 Ω


• Maximum input: +27 dBm


• Test port connectors: Type N female (50 Ω)


• Directivity: 46 dB


• Four receiver channels (two measurement, two reference)

Key Features

• Bidirectional test set with integrated generator and RF switch


• Multiple calibration methods: TOM, TRM, TRL, TNA, TOSM, TOM-X


• Optional AutoKal automatic calibration


• 26 cm color LCD with zoom and segmented diagram axes


• Internal Windows NT PC with keyboard, mouse, and printer interfaces


• Dual IEC/IEEE bus interfaces standard; optional Ethernet (ZVR-B16)


• Two SWR bridges or directional couplers

Typical Applications

• RF component characterization and S-parameter measurement


• Production test environments requiring high speed and accuracy


• Research and development of network devices


• Time-domain analysis capabilities

Compatibility & Integration

• CAE system integration via IEC/IEEE bus


• GPIB connectivity


• Optional Ethernet interface


• External monitor support