Ametek / VTI Instruments / VXI Technology VT1419A Multifunction Plus Module

The Ametek/VTI Instruments/VXI Technology VT1419A is a C-size, single-slot VXI multifunction module engineered for data acquisition and control in mixed-signal and mixed-sensor test environments. Register-based architecture supports flexible signal conditioning through interchangeable Signal Conditioning Plug-ons (SCPs), enabling both analog and digital input/output configurations without requiring additional VXI modules. On-board Engineering Unit (EU) conversion and real-time decision-making capabilities streamline measurement workflows while improving calibration accuracy and repeatability.

Technical Specifications

• Form Factor: C-size, single-slot VXI module


• Interface: Register-based VXIbus


• Architecture: Scalable, multifunction design


• Signal Conditioning: Interchangeable SCP modules (sold separately)


• Data Processing: On-board EU conversion


• Control: Real-time decision-making


• NSN: 6625-01-645-8107

Key Features

• Integrated signal conditioning reduces module count and enhances measurement repeatability


• SCP modularity supports diverse input/output configurations including analog inputs with gain and filtering, frequency and period measurement, totalizing, PWM and FM signal processing, D/A conversion (voltage and current), digital outputs (8- or 16-bit), pulse generation with variable frequency and PWM control, and stepper motor control


• Scalable architecture accommodates design verification of electromechanical components and assemblies


• Terminal blocks supplied separately

Typical Applications

• Design verification testing of electromechanical systems


• Mixed-signal data acquisition


• Multi-sensor monitoring and control


• Real-time measurement and decision logic

Compatibility & Integration The VT1419A integrates into VXIbus-based test systems and works with Ametek/VTI Instruments/VXI Technology VXI modules and mainframes. SCP module selection determines specific input/output capabilities required for each test configuration.