HP / Agilent 83622A Synthesized Sweeper, 2 to 20 GHz

The HP/Agilent 83622A is a synthesized signal generator covering 2 to 20 GHz for RF and microwave component and system testing in aerospace, defense, and communications. Its phase-locked architecture delivers frequency resolution to 1 kHz (1 Hz with Option 008) and exceptional spectral purity - harmonics suppressed at least 50 dB below the carrier across the operating range, with phase noise of −76 dBc/Hz at 20 GHz and 10 kHz offset.

Technical Specifications

• Frequency Range: 2 to 20 GHz


• Frequency Resolution: 1 kHz (standard); 1 Hz (Option 008)


• RF Output Power: +20 dBm to −110 dBm with Option 001; maximum leveled power +13 dBm; sweep range −20 dBm to maximum


• Power Control Resolution: 0.02 dB


• Phase Noise (SSB): −76 dBc/Hz at 20 GHz, 10 kHz offset


• Harmonic Suppression: ≥50 dB below carrier (2.2 to 20 GHz)


• Frequency Stability: 5 × 10⁻¹⁰/day drift; 1 × 10⁻⁹/year (after 30-day warm-up)

Modulation & Sweep Capabilities Pulse Modulation

• On/Off Ratio: >80 dB


• Rise/Fall Times: <25 ns (standard); <10 ns (Option 006 Fast Pulse)


• Minimum RF Pulse Width: <50 ns (standard); <15 ns (Option 006)


• Period: 300 ns to 400 ms with 25 ns resolution


• Width Range: 25 ns to 400 ms; accuracy ±5 ns Amplitude Modulation


• Modes: Linear AM (100%/V) and Scan Modulation (10 dB/V)


• Bandwidth (−3 dB): DC to 100 kHz


• Modulation Depth: 0 to 90% (20 dB) and 0 to 99.7% (50 dB) above 10 Hz Frequency Modulation


• Maximum Deviation: 8 MHz


• Modulation Rate (500 kHz deviation, locked): 100 kHz to 8 MHz Sweep Modes: Step, List, Ramp

Key Features

• Scan modulation for antenna pattern simulation


• Fixed and swept frequency offset for two-tone measurements


• User-selectable flatness correction for remote leveling


• General-purpose RF source for component characterization

Typical Applications Aerospace and defense RF/microwave system validation; communications component testing; antenna and receiver characterization; two-tone and intermodulation measurements.